Analyzing Reliability of Memory Subsystems with Double Chipkill Detect/Correct

Hits: 1909
Year:
2013
Type of Publication:
Article
Authors:
  • Jian, X
  • DeBardeleben, N
  • Blanchard, S
  • Sridharan, V
  • Kumar, R
Journal:
The 19th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2013)
Volume:
Vancouver, BC, Canada
Month:
December 2-4, 2013
BibTex:
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